会议论文详细信息
Electron Microscopy and Analysis Group Conference 2013 | |
Exit wave reconstruction of radiation-sensitive materials from low-dose data | |
Huang, C.^1 ; Borisenko, K.B.^1 ; Kirkland, A.I.^1 | |
Department of Materials, University of Oxford, Parks Road, OX1 3PH Oxford, United Kingdom^1 | |
关键词: Atomic resolution; Exit waves; Low dose; Radiation-sensitive materials; | |
Others : https://iopscience.iop.org/article/10.1088/1742-6596/522/1/012052/pdf DOI : 10.1088/1742-6596/522/1/012052 |
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来源: IOP | |
【 摘 要 】
We report exit wave reconstruction using a focal series of low-dose images for ZSM-5, a zeolite which has a wide range of industrial applications. The exit wave phase was successfully reconstructed showing the structure of ZSM-5 at a near-atomic resolution even though the dose in the individual images in the focal series was as low as 26 electrons/A2. This implementation shows the method's potential for application to other radiation-sensitive materials.
【 预 览 】
Files | Size | Format | View |
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Exit wave reconstruction of radiation-sensitive materials from low-dose data | 1448KB | download |