Exit wave reconstruction of radiation-sensitive materials from low-dose data

Electron Microscopy and Analysis Group Conference 2013

Huang, C.^1 ; Borisenko, K.B.^1 ; Kirkland, A.I.^1

Department of Materials, University of Oxford, Parks Road, OX1 3PH Oxford, United Kingdom^1

关键词: Atomic resolution;    Exit waves;    Low dose;    Radiation-sensitive materials;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/522/1/012052/pdf
DOI  :  10.1088/1742-6596/522/1/012052

来源: IOP

【 摘 要 】

We report exit wave reconstruction using a focal series of low-dose images for ZSM-5, a zeolite which has a wide range of industrial applications. The exit wave phase was successfully reconstructed showing the structure of ZSM-5 at a near-atomic resolution even though the dose in the individual images in the focal series was as low as 26 electrons/A2. This implementation shows the method's potential for application to other radiation-sensitive materials.