会议论文详细信息
Electron Microscopy and Analysis Group Conference 2013 | |
High resolution electron exit wave reconstruction from a diffraction pattern using Gaussian basis decomposition | |
Borisenko, Konstantin B.^1 ; Kirkland, Angus I.^1 | |
Department of Materials, University of Oxford, Parks Road, OX1 3PH Oxford, United Kingdom^1 | |
关键词: Basis decomposition; Diffraction intensity; Electron exit waves; Exit waves; High resolution; Optimisations; Overdetermined systems; Weak phase object; | |
Others : https://iopscience.iop.org/article/10.1088/1742-6596/522/1/012019/pdf DOI : 10.1088/1742-6596/522/1/012019 |
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来源: IOP | |
【 摘 要 】
We describe an algorithm to reconstruct the electron exit wave of a weak-phase object from single diffraction pattern. The algorithm uses analytic formulations describing the diffraction intensities through a representation of the object exit wave in a Gaussian basis. The reconstruction is achieved by solving an overdetermined system of non-linear equations using an easily parallelisable global multi-start search with Levenberg-Marquard optimisation and analytic derivatives.
【 预 览 】
Files | Size | Format | View |
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High resolution electron exit wave reconstruction from a diffraction pattern using Gaussian basis decomposition | 1153KB | download |