High resolution electron exit wave reconstruction from a diffraction pattern using Gaussian basis decomposition

Electron Microscopy and Analysis Group Conference 2013

Borisenko, Konstantin B.^1 ; Kirkland, Angus I.^1

Department of Materials, University of Oxford, Parks Road, OX1 3PH Oxford, United Kingdom^1

关键词: Basis decomposition;    Diffraction intensity;    Electron exit waves;    Exit waves;    High resolution;    Optimisations;    Overdetermined systems;    Weak phase object;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/522/1/012019/pdf
DOI  :  10.1088/1742-6596/522/1/012019

来源: IOP

【 摘 要 】

We describe an algorithm to reconstruct the electron exit wave of a weak-phase object from single diffraction pattern. The algorithm uses analytic formulations describing the diffraction intensities through a representation of the object exit wave in a Gaussian basis. The reconstruction is achieved by solving an overdetermined system of non-linear equations using an easily parallelisable global multi-start search with Levenberg-Marquard optimisation and analytic derivatives.