科技报告详细信息
Atomic-Resolution 3D Electron Microscopy with Dynamic Diffraction.
O'Keefe, M. ; Downing, K. H. ; Wenk, H. R. ; Meisheng, H.
Technical Information Center Oak Ridge Tennessee
关键词: Electron microscopy;    Tomography;    Electron beam;    Atomic resolution;    Nanoparticles;   
RP-ID  :  DE2005842049
学科分类:工程和技术(综合)
美国|英语
来源: National Technical Reports Library
PDF
【 摘 要 】

Achievement of atomic-resolution electron-beam tomography will allow determination of the three dimensional structure of nanoparticles (and other suitable specimens) at atomic resolution. Three dimensional reconstructions will yield 'section' images that resolve atoms overlapped in normal electron microscope images (projections), resolving lighter atoms such as oxygen in the presence of heavier atoms, and atoms that lie on non-lattice sites such as those in non-periodic defect structures.

【 预 览 】
附件列表
Files Size Format View
DE2005842049.pdf 315KB PDF download
  文献评价指标  
  下载次数:21次 浏览次数:21次