科技报告详细信息
Atomic-Resolution 3D Electron Microscopy with Dynamic Diffraction. | |
O'Keefe, M. ; Downing, K. H. ; Wenk, H. R. ; Meisheng, H. | |
Technical Information Center Oak Ridge Tennessee | |
关键词: Electron microscopy; Tomography; Electron beam; Atomic resolution; Nanoparticles; | |
RP-ID : DE2005842049 | |
学科分类:工程和技术(综合) | |
美国|英语 | |
来源: National Technical Reports Library | |
【 摘 要 】
Achievement of atomic-resolution electron-beam tomography will allow determination of the three dimensional structure of nanoparticles (and other suitable specimens) at atomic resolution. Three dimensional reconstructions will yield 'section' images that resolve atoms overlapped in normal electron microscope images (projections), resolving lighter atoms such as oxygen in the presence of heavier atoms, and atoms that lie on non-lattice sites such as those in non-periodic defect structures.
【 预 览 】
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DE2005842049.pdf | 315KB | download |