Development of an environmental high voltage electron microscope and its application to nano and bio-materials

Electron Microscopy and Analysis Group Conference 2013

Tanaka, N.^1 ; Usukura, J.^1 ; Kusunoki, M.^1 ; Saito, Y.^2 ; Sasaki, K.^2 ; Tanji, T.^1 ; Muto, S.^1 ; Arai, S.^1

Ecotopia Science Institute, Nagoya University, Chikusa-ku, 464-8603 Nagoya, Japan^1

Graduate School of Engineering, Nagoya University, Chikusa-ku, 464-8603 Nagoya, Japan^2

关键词: Aberration correctors;    Atomic resolution;    Electron tomography;    Environmental transmission electron microscopy;    Gaseous atmosphere;    High voltage electron microscope;    Mechanical operations;    Ultrahigh resolution;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/522/1/012008/pdf
DOI  :  10.1088/1742-6596/522/1/012008

来源: IOP

【 摘 要 】

Environmental transmission electron microscopy has recently emerged as topics of great interest as well as ultra-high resolution electron microscopy using aberration correctors. Current research in this area has been focusing on dynamic observation with atomic resolution under gaseous atmospheres and in liquids. Nagoya University has been developing a new 1-MV high voltage (scanning) transmission electron microscope, which can be used to observe nano-materials under conditions that include the presence of gases, liquids and illuminating lights, and it can be also used to perform mechanical operations to nm-sized areas as well as electron tomography and elemental analysis by electron energy loss spectroscopy.