Investigation of metallic nanoparticles adsorbed on the QCM sensor by SEM and AFM techniques

Bulletin of Materials Science

CRISTIANA RADULESCU^1,2¹  ION V POPESCU^2,3²  IOAN ALIN BUCURICA^1³ 

[1]Academy of Romanian Scientists, 050094 Bucharest, Romania^3

[2]Faculty of Sciences and Arts, Valahia University of Targoviste, 130004 Târgovi¸ste, Romania^2

[3]Institute of Multidisciplinary Research for Science and Technology, Valahia University of Targoviste, 130004 Târgovi¸ste, Romania^1

关键词: Metallic nanoparticles;    QCM;    AFM;    SEM;    SEM-EDS.;   

DOI  :  

学科分类：材料工程

来源: Indian Academy of Sciences

【 摘 要 】

Quartz crystal microbalance (QCM) is known as a very sensitive device used for determination of mass quantity adsorbed on sensor surface. Its detection limits are in the range of ng cm$^{−2}$. The adsorption mechanism of metallic nanoparticles on QCM sensor was investigated by scanning electron microscopy (SEM) and atomic force microscopy (AFM). This study aims to highlight the importance of QCM applications in nanoparticles deposition field. The layers formed through adsorption process, induced by the oscillations of the QCM sensor, were investigated by AFM for surface topography and for particle mean size values. The morphology of layers and nanoparticles dimensions were determined by SEM. For a more complex investigation of the nanoparticles adsorption mechanism, the chemical composition of layers was achieved usingSEM coupled with energy dispersive X-ray spectrometer (SEM-EDS). This preliminary research involved a new approach in characterization of metallic nanoparticles layers to achieve functional assembled monolayers.

【 授权许可】

CC BY