Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D Mapping of Conservative and Dissipative Probe-Sample Interactions of Energy-Relevant Materials

Solares, Santiago D.¹ 

[1] Univ. of Maryland, College Park, MD (United States)

关键词: Multifrequency atomic force microscopy;    AFM;   

DOI  :  10.2172/1215400
RP-ID  :  DESC0008151
PID  :  OSTI ID: 1215400

学科分类：纳米科学和纳米技术

美国|英语

来源: SciTech Connect

【 摘 要 】

This project focused on the development of single-pass multifrequency atomic force microscopy methods for the rapid multi-function nanoscale characterization of energy-relevant materials.