Low Power Testing—What Can Commercial Design-for-Test Tools Provide?

Journal of Low Power Electronics and Applications

关键词: low-power design;    low-power testing;    scan testing;    test compression;    DFT tools;   

DOI  :  10.3390/jlpea1030357

来源: mdpi

【 摘 要 】

Minimizing power consumption during functional operation and during manufacturing tests has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial design-for-test (DFT) tools' point of view, this paper describes how DFT tools can help to achieve comprehensive testing of low power designs and reduce test power consumption during test application.

【 授权许可】

CC BY   
© 2011 by the authors; licensee MDPI, Basel, Switzerland.