期刊论文详细信息
Optica Applicata
Photoreflectance study of partially relaxed epitaxial InGaAs on GaAs
Jan Misiewicz1  Robert Kudrawiec1  Lukasz Gelczuk1  Marcin Motyka1  Maria Dabrowska-Szata,Jaroslaw Serafinczuk1 
关键词: III-V semiconductors;    PR spectroscopy;    X-ray diffraction;    strain relaxation;    gallium indium arsenide;   
DOI  :  
学科分类:光谱学
来源: Politechnika Wroclawska * Oficyna Wydawnicza / Wroclaw University of Technology
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