X-Ray Diffraction Project Final Report, Fiscal Year 2006.

Technical Information Center Oak Ridge Tennessee

关键词: X-ray diffraction;    Silicon;    Crystals;    Pulses;    Gas guns;   

RP-ID  :  DE2007914425

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

An x-ray diffraction diagnostic system was developed for determining real-time shock-driven lattice parameter shifts in single crystals at the gas gun at TA-IV at Sandia National Laboratories (SNL). The signal-to-noise ratio and resolution of the system were measured using imaging plates as the detector and by varying the slit width. This report includes tests of the x-ray diffraction system using a phosphor coupled to a charge-coupled device (CCD) camera by a coherent fiber-optic bundle. The system timing delay was measured with a newly installed transistor-transistor logic (TTL) bypass designed to reduce the x-ray delay time. The axial misalignment of the Bragg planes was determined with respect to the optical axis for a set of eight LiF (lithium fluoride) crystals provided by SNL to determine their suitability for gas gun experiments.