X-ray Emission Collected in a Novel Energy Dispersive Approach

17th Pan-American Synchrotron Radiation Instrumentation Conference

Finkelstein, K.D.^1 ; Agyeman-Budu, D.^1 ; Lyndaker, A.^1 ; Pollock, C.^1 ; Krawczyk, T.^1

CHESS Cornell University, Max-Plank Institute fur Chemische Energiekonversion, Germany^1

关键词: Bragg diffraction;    Crystal spectrometer;    Deep Reactive Ion Etching;    Energy dispersions;    Energy dispersive;    Silicon on insulator wafers;    Wide energy range;    X-ray emission spectra;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/493/1/012033/pdf
DOI  :  10.1088/1742-6596/493/1/012033

来源: IOP

【 摘 要 】

Novel methods & materials have been used to produce dynamically bent Bragg diffraction analyzer crystals in a modified von Hamos geometry.They are used to collect a wide energy range X-ray emission spectrum over a large solid angle with electron volt resolution. Crystals fabricated from silicon-on-insulator wafers by photolithography and deep reactive ion etching can bend to 10 cm radius without increased lattice strain. The design permits adjustment of energy dispersion for individual analyzers in an array. A multilayer mono, mono-capillary focusing, and multi-crystal spectrometer together collect signals at a bend magnet beamline comparable to those from an undulator. Preliminary measurements validate this new energy dispersive spectrometer.