Analysis and Optimization of 1200V Silicon Carbide Bipolar Junction Transistor

degradation;current gain;sic;bipolar junction transistor

Gao, Yan ; Mo-Yuen Chow, Committee Member,Mesut E Baran, Committee Member,Alex Q. Huang, Committee Chair,Doug Barlage, Committee Member,Gao, Yan ; Mo-Yuen Chow ; Committee Member ; Mesut E Baran ; Committee Member ; Alex Q. Huang ; Committee Chair ; Doug Barlage ; Committee Member

University:North Carolina State University

关键词: degradation;    current gain;    sic;    bipolar junction transistor;   

Others  :  https://repository.lib.ncsu.edu/bitstream/handle/1840.16/4818/etd.pdf?sequence=1&isAllowed=y

美国|英语

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