Photothermal Stability of an E-Beam Pre-Crosslinked EVA Encapsulant and Its Performance Degradation on a-Si Submodules: Preprint.

Pern, F. J. ; Watson, G. L. ; Glick, S. H. ; Raaff, J.

Technical Information Center Oak Ridge Tennessee

关键词: Meetings;    Photothermal properties;    Accelerated tests;    Stability;    Degradation;   

RP-ID  :  DE200215000039

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

Presented at the 2001 NCPV Program Review Meeting: Study of photothermal stability of special EVA encapsulant by accelerated exposure testing and analysis of causes of performance degradation on a-Si modules.