科技报告详细信息
Defect Analysis of Roll-to-Roll SAIL Manufactured Flexible Display Backplanes | |
Taussig, Carl ; Elder, Richard E. ; Jackson, Warren B. ; Jeans, Albert ; Jam, Mehrban ; Holland, Ed ; Luo, Hao ; Maltabes, John ; Perlov, Craig ; Trovinger, Steven ; Almanza-Workman, Marcia ; Garcia, Robert A. ; Kim, HanJun ; Kwon, Ohseung ; Jeffrey, Frank | |
HP Development Company | |
关键词: SAIL; flexible displays; roll-to-roll; | |
RP-ID : HPL-2011-35 | |
学科分类:计算机科学(综合) | |
美国|英语 | |
来源: HP Labs | |
【 摘 要 】
HP and Phicot have made the world's first roll-to-roll (R2R) manufactured active matrix displays. Currently we are developing a wrist-worn solar powered display for the U.S. Army. As we scale from research to preproduction on our 1/3 meter wide pilot line defect analysis and mitigation is our primary focus. In this presentation we will review the self-aligned imprint lithography (SAIL) process and discuss defects we observe, and the tools, and processes we have developed to detect and eliminate them.
【 预 览 】
Files | Size | Format | View |
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RO201804100002914LZ | 398KB | download |