Fault-Tolerant Architecture for Reliable Integrated Gate Drivers

IEEE Journal of the Electron Devices Society

Jongbin Kim¹  Seung-Woo Lee¹  Hoon-Ju Chung² 

[1] Department of Information Display and Advanced Display Research Center, Kyung Hee University, Seoul, South Korea;School of Electronic Engineering, Kumoh National Institute of Technology, Gumi, South Korea;

关键词: Fault tolerance;    flexible displays;    integrated gate drivers;   

DOI  :  10.1109/JEDS.2019.2943542

来源: DOAJ

【 摘 要 】

This paper proposes fault-tolerant (FT) architecture for integrated gate drivers. It can automatically detect faults in the gate driver caused by external physical stress and then immediately repair them as well. As a result, it can contribute to highly reliable display products. The proposed architecture uses redundant circuit structure with fault detection circuit. The detailed algorithm for the proposed method is presented in this paper. Simulation and measurement results verify that the proposed circuit and its driving algorithm operates successfully. Finally, the display system architecture is also suggested for realization of our FT method.

【 授权许可】

Unknown