Final Report - SRNL Agreement #AC51296V SEM, FIB, TEM Studies of CZT Samples

Bradley, J ; Dai, Z R ; Graham, G A ; Teslich, N E

关键词: CADMIUM;    ZINC;    TELLURIUM;    CERAMICS;    SCANNING ELECTRON MICROSCOPY;    TRANSMISSION ELECTRON MICROSCOPY;    SURFACE PROPERTIES;    PHASE STUDIES;   

DOI  :  10.2172/924965
RP-ID  :  UCRL-TR-234106
PID  :  OSTI ID: 924965
Others  :  TRN: US200809%%650

学科分类：社会科学、人文和艺术（综合）

美国|英语

来源: SciTech Connect

【 摘 要 】

The aims of this study are: (1) to characterize the surfaces of samples 3-7-8-3 and 4-1-3 using SEM, FIB and TEM techniques; (2) identify raised surface features; (3) prepare FIB-TEM lift-out sections from identified raised surfaces; and (4) perform detailed TEM characterization of FIB Sections. Focusing on the composition and crystallinity of the phases within the sections, including impurities.