THIN SOLID FILMS | 卷:574 |
Transport characteristics of Pd Schottky barrier diodes on epitaxial n-GaSb as determined from temperature dependent current-voltage measurements | |
Article | |
Venter, A.1  Murape, D. M.1  Botha, J. R.1  Auret, F. D.2  | |
[1] Nelson Mandela Metropolitan Univ, Dept Phys, ZA-6031 Port Elizabeth, South Africa | |
[2] Univ Pretoria, Dept Phys, ZA-0002 Pretoria, South Africa | |
关键词: Current-voltage measurements; Transport characteristics; Barrier height; Gaussian distribution; | |
DOI : 10.1016/j.tsf.2014.11.057 | |
来源: Elsevier | |
【 摘 要 】
The temperature dependent transport characteristics of Pd/n-GaSb:Te Schottky contacts with low and saturating reverse current are investigated by means of current-voltage measurements between 80 K and 320 K. The apparent barrier height and ideality factor increase with a decrease in temperature. Neither thermionic nor thermionic field emission can explain the low temperature characteristics of these diodes. Instead, evidence is presented for barrier inhomogeneity across the metal/semiconductor contact. A plot of the barrier height, phi(b) vs. 1/2kT revealed a double Gaussian distribution for the barrier height with phi(b,mean) assuming values of 0.59 eV +/- 0.07 (80-140 K) and 0.25 eV +/- 0.12 (140-320 K) respectively. (C) 2014 Elsevier B.V. All rights reserved.
【 授权许可】
Free
【 预 览 】
Files | Size | Format | View |
---|---|---|---|
10_1016_j_tsf_2014_11_057.pdf | 811KB | download |