Structural, morphological and optical properties of ZnO films by thermal oxidation of ZnSe films

THIN SOLID FILMS

卷:634

Article

Ou, Kai¹  Wang, Shenwei¹  Wan, Guangmiao¹  Zhang, Xinwu¹  Duan, Xiaoxia¹  Yi, Lixin¹ 

[1] Beijing Jiaotong Univ, Inst Optoelect Technol, Key Lab Luminescence & Opt Informat, Minist Educ, Beijing 100044, Peoples R China

关键词: Zinc selenide;    Zinc oxide;    Thermal oxidation;    Thin films;    Annealing;   

DOI  :  10.1016/j.tsf.2017.05.012

来源: Elsevier

【 摘 要 】

In this work, zinc oxide (ZnO) thin films were synthesized by thermal oxidation of zinc selenide films in oxygen atmosphere without introducing any catalysts or additives. According to the X-ray diffraction and morphology analysis, the ZnO films were hexagonal wurtzite structure, indicating the high crystalline quality. Strong emission peak at around 370 nm (ultraviolet) and weak emission peak at 525 nm (green) were observed in the photoluminescence spectra. The dependence of photoluminescence intensity on annealing conditions was investigated in the experiment. With the increase of annealing temperature and time, the photoluminescence intensity reached a peak at 450 degrees C for 45 min in oxygen, which was considered to be the optimal condition. (C) 2017 Elsevier B.V. All rights reserved.

【 授权许可】

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