Grazing incidence resonant soft X-ray scattering for analysis of multi-component polymer-fullerene blend thin films

POLYMER

卷:105

Article

Schaffer, Christoph J.¹  Wang, Cheng²  Hexemer, Alexander²  Mueller-Buschbaum, Peter¹ 

[1] Tech Univ Munich, Phys Dept, Lehrstuhl Funkt Mat, James Franck Str 1, D-85748 Garching, Germany

[2] Lawrence Berkeley Natl Lab, Adv Light Source, 1 Cyclotron Rd, Berkeley, CA 94720 USA

关键词: GI-RSoXS;    GISAXS;    Polymer blend;    Conducting polymer;    Organic photovoltaics;   

DOI  :  10.1016/j.polymer.2016.05.056

来源: Elsevier

【 摘 要 】

Grazing incidence small angle X-ray scattering (GISAXS) methods are frequently very successfully utilized for morphological investigations of thin polymer blend films used in organic photovoltaics. However, conventional GISAXS does no longer provide material sensitivity when the blend consists of more than two components due to the contrast conditions. In case of multi-component blends the use of grazing incidence resonant soft X-ray scattering (GI-RSoXS) can overcome such problems. In this work we exemplarily apply GI-RSoXS to investigate simultaneously the vertical and lateral morphology of polymer-fullerene bulk heterojunction layers made from poly[2,1,3-benzothiadiazole-4,7-diyl[4,4-bis(2-ethylhexyl)-4H-cyclopenta[2,1-b:3,4-b']dithiophene-2,6-diyl]] (PCPDTBT) and [6,6]-penyl-C 61 butyric acid methyl ester (PCBM) with added photosensitizer perylene diimide (PDI) with and without use of the solvent additive 1,8-octanedithiol (ODT). The investigation reveals that films without solvent additive ODT tend to show only vertical phase separation while films prepared with solvent additive also phase separate laterally. PDI seems to assist lateral phase separation between PCPDTBT and PCBM by expelling PCBM from the amorphous polymer matrix. (C) 2016 Elsevier Ltd. All rights reserved.

【 授权许可】

Free