Chinese Journal of Mechanical Engineering | |
Detection and Characterization of Defects in Additive Manufacturing by Polarization-Based Imaging System | |
Original Article | |
Lingbao Kong1  Xing Peng2  | |
[1]Shanghai Engineering Research Center of Ultra-precision Optical Manufacturing, School of Information Science and Technology, Fudan University, 200438, Shanghai, China | |
[2]Shanghai Engineering Research Center of Ultra-precision Optical Manufacturing, School of Information Science and Technology, Fudan University, 200438, Shanghai, China | |
[3]College of Intelligent Science and Technology, National University of Defense Technology, 410003, Changsha, Hunan, China | |
关键词: Additive manufacturing; Selective laser melting; High reflection; Defect characterization; Polarization-based imaging; | |
DOI : 10.1186/s10033-023-00943-0 | |
received in 2022-07-09, accepted in 2023-09-01, 发布年份 2023 | |
来源: Springer | |
![]() |
【 摘 要 】
Additive manufacturing (AM) technology such as selective laser melting (SLM) often produces a high reflection phenomenon that makes defect detection and information extraction challenging. Meanwhile, it is essential to establish a characterization method for defect analysis to provide sufficient information for process diagnosis and optimization. However, there is still a lack of universal standards for the characterization of defects in SLM parts. In this study, a polarization-based imaging system was proposed, and a set of characterization parameters for SLM defects was established. The contrast, defect contour information, and high reflection suppression effect of the SLM part defects were analyzed. Comparative analysis was conducted on defect characterization parameters, including geometric and texture parameters. The experimental results demonstrated the effects of the polarization imaging system and verified the feasibility of the defect feature extraction and characterization method. The research work provides an effective solution for defect detection and helps to establish a universal standard for defect characterization in additive manufacturing.【 授权许可】
CC BY
© Chinese Mechanical Engineering Society 2023
【 预 览 】
Files | Size | Format | View |
---|---|---|---|
RO202310119040472ZK.pdf | 5712KB | ![]() |
|
Fig. 4 | 548KB | Image | ![]() |
Fig. 1 | 1252KB | Image | ![]() |
MediaObjects/40463_2023_663_MOESM2_ESM.pptx | 184KB | Other | ![]() |
Fig. 8 | 1130KB | Image | ![]() |
MediaObjects/12888_2023_5166_MOESM1_ESM.docx | 28KB | Other | ![]() |
Fig. 2 | 39KB | Image | ![]() |
Fig. 3 | 1616KB | Image | ![]() |
12888_2023_5142_Article_IEq17.gif | 1KB | Image | ![]() |
Table 3 | 78KB | Table | ![]() |
Fig. 2 | 1896KB | Image | ![]() |
Fig. 3 | 3413KB | Image | ![]() |
Fig. 7 | 739KB | Image | ![]() |
13690_2023_1170_Article_IEq100.gif | 1KB | Image | ![]() |
Fig. 2 | 2464KB | Image | ![]() |
MediaObjects/41408_2023_921_MOESM1_ESM.docx | 686KB | Other | ![]() |
Fig. 2 | 366KB | Image | ![]() |
Fig. 1 | 618KB | Image | ![]() |
Fig. 2 | 217KB | Image | ![]() |
Fig. 2 | 1279KB | Image | ![]() |
MediaObjects/13690_2023_1177_MOESM2_ESM.docx | 26KB | Other | ![]() |
MediaObjects/13690_2023_1177_MOESM3_ESM.docx | 14KB | Other | ![]() |
13690_2023_1170_Article_IEq23.gif | 1KB | Image | ![]() |
MediaObjects/13690_2023_1177_MOESM4_ESM.docx | 12KB | Other | ![]() |
MediaObjects/12902_2023_1450_MOESM2_ESM.docx | 16KB | Other | ![]() |
Fig. 1 | 40KB | Image | ![]() |
Fig. 6 | 69KB | Image | ![]() |
Fig. 6 | 295KB | Image | ![]() |
Fig. 1 | 167KB | Image | ![]() |
Fig. 2 | 622KB | Image | ![]() |
MediaObjects/40644_2023_609_MOESM1_ESM.docx | 23KB | Other | ![]() |
MediaObjects/12888_2023_5155_MOESM3_ESM.docx | 16KB | Other | ![]() |
Fig. 4 | 1878KB | Image | ![]() |
Fig. 2 | 802KB | Image | ![]() |
Fig. 1 | 777KB | Image | ![]() |
Fig. 2 | 39KB | Image | ![]() |
Fig. 5 | 563KB | Image | ![]() |
Fig. 4 | 1094KB | Image | ![]() |
MediaObjects/13045_2023_1491_MOESM4_ESM.docx | 239KB | Other | ![]() |
Fig. 7 | 727KB | Image | ![]() |
12951_2023_2095_Article_IEq4.gif | 1KB | Image | ![]() |
12951_2023_2095_Article_IEq5.gif | 1KB | Image | ![]() |
Fig. 6 | 2149KB | Image | ![]() |
12951_2023_2095_Article_IEq6.gif | 1KB | Image | ![]() |
MediaObjects/41408_2023_917_MOESM1_ESM.pdf | 1732KB | ![]() |
|
12951_2023_2095_Article_IEq11.gif | 1KB | Image | ![]() |
12936_2023_4724_Article_IEq15.gif | 1KB | Image | ![]() |
12888_2023_5142_Article_IEq20.gif | 1KB | Image | ![]() |
12888_2023_5142_Article_IEq12.gif | 1KB | Image | ![]() |
12888_2023_5142_Article_IEq14.gif | 1KB | Image | ![]() |
Fig. 7 | 4841KB | Image | ![]() |
13690_2023_1170_Article_IEq79.gif | 1KB | Image | ![]() |
MediaObjects/12936_2023_4673_MOESM3_ESM.tif | 80KB | Other | ![]() |
Fig. 1 | 1945KB | Image | ![]() |
Fig. 2 | 30KB | Image | ![]() |
Fig. 5 | 610KB | Image | ![]() |
MediaObjects/42004_2023_1001_MOESM3_ESM.xlsx | 1413KB | Other | ![]() |
13690_2023_1170_Article_IEq214.gif | 1KB | Image | ![]() |
40708_2023_201_Article_IEq6.gif | 1KB | Image | ![]() |
MediaObjects/12888_2023_5161_MOESM1_ESM.docx | 15KB | Other | ![]() |
Fig. 1 | 207KB | Image | ![]() |
MediaObjects/12888_2023_5130_MOESM1_ESM.docx | 153KB | Other | ![]() |
Fig. 2 | 831KB | Image | ![]() |
Fig. 5 | 79KB | Image | ![]() |
Fig. 6 | 237KB | Image | ![]() |
Fig. 6 | 81KB | Image | ![]() |
Fig. 2 | 91KB | Image | ![]() |
Fig. 4 | 165KB | Image | ![]() |
13690_2023_1170_Article_IEq94.gif | 1KB | Image | ![]() |
13690_2023_1170_Article_IEq95.gif | 1KB | Image | ![]() |
13690_2023_1170_Article_IEq96.gif | 1KB | Image | ![]() |
13690_2023_1170_Article_IEq97.gif | 1KB | Image | ![]() |
Fig. 3 | 1976KB | Image | ![]() |
Fig. 6 | 3544KB | Image | ![]() |
Fig. 1 | 53KB | Image | ![]() |
MediaObjects/41408_2023_921_MOESM1_ESM.docx | 686KB | Other | ![]() |
Fig. 2 | 366KB | Image | ![]() |
Fig. 7 | 830KB | Image | ![]() |
Fig. 4 | 861KB | Image | ![]() |
MediaObjects/13395_2023_324_MOESM1_ESM.docx | 7665KB | Other | ![]() |
Fig. 5 | 415KB | Image | ![]() |
13015_2023_241_Article_IEq346.gif | 1KB | Image | ![]() |
MediaObjects/12888_2023_5074_MOESM1_ESM.docx | 122KB | Other | ![]() |
Fig. 2 | 589KB | Image | ![]() |
MediaObjects/12888_2023_5199_MOESM2_ESM.pdf | 263KB | ![]() |
|
MediaObjects/12888_2023_5151_MOESM1_ESM.docx | 155KB | Other | ![]() |
MediaObjects/13570_2023_286_MOESM1_ESM.docx | 29KB | Other | ![]() |
Fig. 2 | 406KB | Image | ![]() |
Fig. 1 | 1222KB | Image | ![]() |
MediaObjects/12888_2023_5196_MOESM1_ESM.docx | 66KB | Other | ![]() |
Fig. 12 | 43KB | Image | ![]() |
MediaObjects/12951_2023_2105_MOESM2_ESM.xlsx | 292KB | Other | ![]() |
Fig. 6 | 2836KB | Image | ![]() |
Fig. 1 | 1111KB | Image | ![]() |
Fig. 7 | 2075KB | Image | ![]() |
13690_2023_1170_Article_IEq1.gif | 1KB | Image | ![]() |
Fig. 1 | 1571KB | Image | ![]() |
13690_2023_1170_Article_IEq2.gif | 1KB | Image | ![]() |
13690_2023_1170_Article_IEq115.gif | 1KB | Image | ![]() |
Fig. 1 | 230KB | Image | ![]() |
Fig. 4 | 1314KB | Image | ![]() |
Fig. 5 | 399KB | Image | ![]() |
13690_2023_1170_Article_IEq122.gif | 1KB | Image | ![]() |
13690_2023_1170_Article_IEq123.gif | 1KB | Image | ![]() |
13690_2023_1170_Article_IEq124.gif | 1KB | Image | ![]() |
13690_2023_1170_Article_IEq125.gif | 1KB | Image | ![]() |
Fig. 4 | 1655KB | Image | ![]() |
40677_2023_249_Article_IEq13.gif | 1KB | Image | ![]() |
Fig. 6 | 2562KB | Image | ![]() |
MediaObjects/12888_2023_5185_MOESM1_ESM.docx | 59KB | Other | ![]() |
Fig. 3 | 618KB | Image | ![]() |
Fig. 5 | 426KB | Image | ![]() |
Fig. 2 | 345KB | Image | ![]() |
Fig. 7 | 1173KB | Image | ![]() |
MediaObjects/40644_2023_604_MOESM2_ESM.docx | 1783KB | Other | ![]() |
41408_2023_919_Article_IEq12.gif | 1KB | Image | ![]() |
41408_2023_919_Article_IEq13.gif | 1KB | Image | ![]() |
41408_2023_919_Article_IEq14.gif | 1KB | Image | ![]() |
41408_2023_919_Article_IEq15.gif | 1KB | Image | ![]() |
41408_2023_919_Article_IEq16.gif | 1KB | Image | ![]() |
Fig. 1 | 604KB | Image | ![]() |
1962KB | Image | ![]() |
|
Fig. 2 | 600KB | Image | ![]() |
13690_2023_1170_Article_IEq18.gif | 1KB | Image | ![]() |
13690_2023_1177_Fige_HTML.png | 10KB | Image | ![]() |
Fig. 1 | 176KB | Image | ![]() |
Fig. 1 | 28KB | Image | ![]() |
MediaObjects/42004_2023_998_MOESM3_ESM.txt | 556KB | Other | ![]() |
12888_2023_5172_Article_IEq52.gif | 1KB | Image | ![]() |
12888_2023_5172_Article_IEq41.gif | 1KB | Image | ![]() |
12888_2023_5172_Article_IEq42.gif | 1KB | Image | ![]() |
Fig. 2 | 243KB | Image | ![]() |
12888_2023_5172_Article_IEq44.gif | 1KB | Image | ![]() |
12888_2023_5172_Article_IEq45.gif | 1KB | Image | ![]() |
12888_2023_5172_Article_IEq46.gif | 1KB | Image | ![]() |
12888_2023_5172_Article_IEq47.gif | 1KB | Image | ![]() |
12888_2023_5172_Article_IEq48.gif | 1KB | Image | ![]() |
Fig. 1 | 457KB | Image | ![]() |
【 图 表 】
Fig. 1
12888_2023_5172_Article_IEq48.gif
12888_2023_5172_Article_IEq47.gif
12888_2023_5172_Article_IEq46.gif
12888_2023_5172_Article_IEq45.gif
12888_2023_5172_Article_IEq44.gif
Fig. 2
12888_2023_5172_Article_IEq42.gif
12888_2023_5172_Article_IEq41.gif
12888_2023_5172_Article_IEq52.gif
Fig. 1
Fig. 1
13690_2023_1177_Fige_HTML.png
13690_2023_1170_Article_IEq18.gif
Fig. 2
Fig. 1
41408_2023_919_Article_IEq16.gif
41408_2023_919_Article_IEq15.gif
41408_2023_919_Article_IEq14.gif
41408_2023_919_Article_IEq13.gif
41408_2023_919_Article_IEq12.gif
Fig. 7
Fig. 2
Fig. 5
Fig. 3
Fig. 6
40677_2023_249_Article_IEq13.gif
Fig. 4
13690_2023_1170_Article_IEq125.gif
13690_2023_1170_Article_IEq124.gif
13690_2023_1170_Article_IEq123.gif
13690_2023_1170_Article_IEq122.gif
Fig. 5
Fig. 4
Fig. 1
13690_2023_1170_Article_IEq115.gif
13690_2023_1170_Article_IEq2.gif
Fig. 1
13690_2023_1170_Article_IEq1.gif
Fig. 7
Fig. 1
Fig. 6
Fig. 12
Fig. 1
Fig. 2
Fig. 2
13015_2023_241_Article_IEq346.gif
Fig. 5
Fig. 4
Fig. 7
Fig. 2
Fig. 1
Fig. 6
Fig. 3
13690_2023_1170_Article_IEq97.gif
13690_2023_1170_Article_IEq96.gif
13690_2023_1170_Article_IEq95.gif
13690_2023_1170_Article_IEq94.gif
Fig. 4
Fig. 2
Fig. 6
Fig. 6
Fig. 5
Fig. 2
Fig. 1
40708_2023_201_Article_IEq6.gif
13690_2023_1170_Article_IEq214.gif
Fig. 5
Fig. 2
Fig. 1
13690_2023_1170_Article_IEq79.gif
Fig. 7
12888_2023_5142_Article_IEq14.gif
12888_2023_5142_Article_IEq12.gif
12888_2023_5142_Article_IEq20.gif
12936_2023_4724_Article_IEq15.gif
12951_2023_2095_Article_IEq11.gif
12951_2023_2095_Article_IEq6.gif
Fig. 6
12951_2023_2095_Article_IEq5.gif
12951_2023_2095_Article_IEq4.gif
Fig. 7
Fig. 4
Fig. 5
Fig. 2
Fig. 1
Fig. 2
Fig. 4
Fig. 2
Fig. 1
Fig. 6
Fig. 6
Fig. 1
13690_2023_1170_Article_IEq23.gif
Fig. 2
Fig. 2
Fig. 1
Fig. 2
Fig. 2
13690_2023_1170_Article_IEq100.gif
Fig. 7
Fig. 3
Fig. 2
12888_2023_5142_Article_IEq17.gif
Fig. 3
Fig. 2
Fig. 8
Fig. 1
Fig. 4
【 参考文献 】
- [1]
- [2]
- [3]
- [4]
- [5]
- [6]
- [7]
- [8]
- [9]
- [10]
- [11]
- [12]
- [13]
- [14]
- [15]
- [16]
- [17]
- [18]
- [19]
- [20]
- [21]
- [22]
- [23]
- [24]
- [25]
- [26]
- [27]
- [28]
- [29]
- [30]
- [31]
- [32]
- [33]
- [34]
- [35]
- [36]
- [37]
- [38]
- [39]
- [40]
- [41]