Millimeter Wave Multi-Port Interferometric Radar Sensors: Evolution of Fabrication and Characterization Technologies

Sensors

Emilia Moldovan¹  Serioja Ovidiu Tatu¹ 

[1] Institut National de la Recherche Scientifique, Centre Energie-Matériaux et Télécommunications, INRS-EMT, Montreal, QC H5A 1K6, Canada;

关键词: antenna array;    integrated circuits;    interferometry;    millimeter wave;    multiport technology;    radar measurements;   

DOI  :  10.3390/s20195477

来源: DOAJ

【 摘 要 】

Recent advances in millimeter wave technologies, both in component and system design, in line with important size and cost reductions, have opened up new applications in ultrahighspeed wireless communications, radar and imaging sensors. The paper presents the evolution of millimeter wave circuit and modules fabrication and characterization technologies in the past decades. Novel planar lowcost fabrication technologies have been successfully developed in this period. In combination with the standard rectangular waveguide technology, these offer great opportunities for prototyping and testing of future millimeter wave transceivers or frontends, which integrate antenna arrays, downconverters, modulators, amplifiers, etc., in a compact fixture. The paper uses, as a suggestive example, the evolution of the multiport interferometric frontends implementation from millimeter wave bulky components and systems to miniaturized and highefficient ones. Circuit and system designs are carefully done to avoid (as much as possible) complicated calibration methods or difficult postprocessing of baseband data. This requires an increased effort in design and fabrication, but it allows miniaturization, lowpower consumption, while keeping very good overall performances. Useful and straightforward laboratory characterization techniques of circuits and systems are described in detail.

【 授权许可】

Unknown