期刊论文详细信息
Modern Electronic Materials | |
Research of acceptor impurity thermal activation in GaN: Mg epitaxial layers | |
Rauf Kh. Akchurin1  Damir R. Sabitov2  Aleksandr V. Mazalov2  Aleksandr A. Marmalyuk2  Vladimir A. Kureshov2  Anatoliy A. Padalitsa2  | |
[1] Moscow State University of Fine Chemical Technologies, 86 Vernadsky Ave., Moscow 119571, Russia;Sigm Plus Co., 3 Vvedenskogo Str., Moscow 117342, Russia; | |
关键词: Gallium nitride; GaN; MOCVD; Metal-organic chemical vapor deposition; Rapid thermal annealing; Magnesium bis-cyclopentadienyl; (Cp2Mg); Doping; p-type; | |
DOI : 10.1016/j.moem.2016.09.003 | |
来源: DOAJ |
【 授权许可】
Unknown