【 摘 要 】
This Letter reports the high gas response for hydrogen gas (H 2 ) in Pd/TiO 2 /Si/Al based metal-oxide semiconductor (MOS) sensor. Titanium oxide (TiO 2 ) thin film deposited on the p-type silicon (Si) substrate is used as the gate oxide of the MOS sensor. The surface morphology of thermally evaporated TiO 2 thin film is investigated for the film structure using atomic force microscopy and scanning electron microscopy. The proposed MOS sensor characterised by capacitance–voltage ( C–V) and conductance–voltage ( G–V) measurements under exposure of different concentration of H 2 gas at room temperature in the ambient-air atmosphere. The maximum gas response of 65% calculated from the change in capacitance and 84% calculated from the change in conductance are obtained for the exposure of 4% of H 2 gas. The obtained maximum gas responses are highly promising for low concentration detection of hydrogen gas (4%) using the fabricated MOS sensor operated at room temperature under zero bias voltage condition.
【 授权许可】
CC BY|CC BY-ND|CC BY-NC|CC BY-NC-ND
【 预 览 】
Files | Size | Format | View |
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RO202107100002514ZK.pdf | 184KB | download |