Structural characterization of lead sulfide thin films by means of X-ray line profile analysis

Bulletin of materials science

N Choudhury¹  B K Sarma¹ 

[1] Department of Physics, Gauhati University, Guwahati 781 014, India$$Department of Physics, Gauhati University, Guwahati 781 014, IndiaDepartment of Physics, Gauhati University, Guwahati 781 014, India$$

关键词: PbS thin films;    X-ray diffraction;    average internal stress;    microstrain.;   

DOI  :  

学科分类：材料工程

来源: Indian Academy of Sciences

【 摘 要 】

X-ray diffraction patterns of chemically deposited lead sulphide thin films have been recorded and X-ray line profile analysis studies have been carried out. The lattice parameter, crystallite size, average internal stress and microstrain in the film are calculated and correlated with molarities of the solutions. Both size and strain are found to contribute towards the broadening of X-ray diffraction line. The values of the crystallite size are found to be within the range from 22�??33 nm and the values of strain to be within the range from 1.0 �? 10^-3�??2.5 �? 10^-3.

【 授权许可】

Unknown