Structural characterization of vacuum evaporated ZnSe thin films

Bulletin of materials science

H L Das¹  B K Sarma¹  Pradip Kr Kalita¹ 

[1] Department of Physics, Gauhati University, Guwahati 781 014, India$$Department of Physics, Gauhati University, Guwahati 781 014, IndiaDepartment of Physics, Gauhati University, Guwahati 781 014, India$$

关键词: ZnSe thin films;    X-ray diffraction;    average internal stress;    microstrain;    dislocation density.;   

DOI  :  

学科分类：材料工程

来源: Indian Academy of Sciences

【 摘 要 】

Thermally evaporated ZnSe thin films deposited on glass substrates within substrate temperatures (�??_s) at 303 K�??623 K are of polycrystalline nature having f.c.c. zincblende structure. The most preferential orientation is along [111] direction for all deposited films together with other abundant planes [220] and [311]. The lattice parameter, grain size, average internal stress, microstrain, dislocation density and degree of preferred orientation in the film are calculated and correlated with �??_s.

【 授权许可】

Unknown