IEICE Electronics Express | |
A signal degradation reduction method for memristor ratioed logic (MRL) gates | |
Xiaowei Li2  Ying Wang2  Yinhe Han2  Bosheng Liu2  Zhiqiang You1  | |
[1] College of Computer Science and Electronic Engineering, Hunan University;State Key Lab of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences | |
关键词: full adder; memristor ratioed logic (MRL) gate; | |
DOI : 10.1587/elex.12.20150062 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
References(10)This paper presents a design strategy of eliminating signal degradation for memristor ratioed logic (MRL) gates. Based on the strategy, a novel MRL-based one-bit full adder is proposed. The inverters in circuit can effectively eliminate the degradation and restore signal integrity. To evaluate the effectiveness of the proposed one-bit full adder, an eight-bit full adder is demonstrated as a study case. Compared to the previous MRL-based standard cell design, the proposed circuit can reduce 11.1% memristor cells, 22.2% CMOS transistors, 38.9% vias, 58% power. Compared to the previous MRL-based optimized design, the proposed design can reduce 11.1% memristor cells, 12.5% CMOS transistors, 98.1% power, 98.1% energy.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
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RO201911300456351ZK.pdf | 818KB | download |