Calibration of electric field probes with three orthogonal elements by standard field method

IEICE Electronics Express

Kaoru Gotoh¹  Yasushi Matsumoto¹  Ifong Wu¹  Shinobu Ishigami¹ 

[1] EMC Group, National Institute of Information and Communication Technology

关键词: electric field probe;    standard field method;    calibration factor;    uncertainty;   

DOI  :  10.1587/elex.6.1032

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(6)Cited-By(2)Electric field probes with three orthogonal elements were calibrated from 1-6GHz by the standard field method in an anechoic chamber. A special jig was constructed for setting and calibrating a Δ-beam-type probe. Calibration factors of the probes were obtained for each element using this jig. To reflect the future revision of IEC 61000-4 series, uncertainty in the calibration factors was investigated to improve calibration quality and determine the factors affecting calibration. We found that fluctuation in the power transmitted from a high power amplifier and the imperfection of the anechoic chamber were the most important factors affecting uncertainty.

【 授权许可】

Unknown