IEICE Electronics Express | |
Calibration of electric field probes with three orthogonal elements by standard field method | |
Kaoru Gotoh1  Yasushi Matsumoto1  Ifong Wu1  Shinobu Ishigami1  | |
[1] EMC Group, National Institute of Information and Communication Technology | |
关键词: electric field probe; standard field method; calibration factor; uncertainty; | |
DOI : 10.1587/elex.6.1032 | |
学科分类:电子、光学、磁材料 | |
来源: Denshi Jouhou Tsuushin Gakkai | |
【 摘 要 】
References(6)Cited-By(2)Electric field probes with three orthogonal elements were calibrated from 1-6GHz by the standard field method in an anechoic chamber. A special jig was constructed for setting and calibrating a Δ-beam-type probe. Calibration factors of the probes were obtained for each element using this jig. To reflect the future revision of IEC 61000-4 series, uncertainty in the calibration factors was investigated to improve calibration quality and determine the factors affecting calibration. We found that fluctuation in the power transmitted from a high power amplifier and the imperfection of the anechoic chamber were the most important factors affecting uncertainty.
【 授权许可】
Unknown
【 预 览 】
Files | Size | Format | View |
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RO201911300375170ZK.pdf | 758KB | download |