Probe calibration by using a different type of probe as a reference in GTEM cell above 1GHz

IEICE Electronics Express

Kaoru Gotoh¹  Yasushi Matsumoto¹  Ifong Wu¹  Shinobu Ishigami¹ 

[1] EMC Group, National Institute of Information and Communications Technology

关键词: electric field probe;    calibration factor;    GTEM cell;    electric field distribution;    uniformity;   

DOI  :  10.1587/elex.7.460

学科分类：电子、光学、磁材料

来源: Denshi Jouhou Tsuushin Gakkai

【 摘 要 】

References(7)Cited-By(3)Calibration of an electric field probe using a different type and size of probe as a reference is carried out in a GTEM cell from 1 to 6GHz. We compared our results with those of calibration in an anechoic chamber to determine the effectiveness of the calibration. The difference between the calibration factors of the GTEM cell and the anechoic chamber increases when the probe is calibrated in an area in which the electric field distribution is nonuniform. Therefore, it is important to place the probe in an area with good uniformity or maintain the uniformity of the electric field in the GTEM cell when calibrating electric field probes with different dimensions.

【 授权许可】

Unknown