期刊论文详细信息
IEICE Electronics Express
Drain current response delay of FD-SOI MOSFETs in RF operation
Yoshiyuki Shimizu1  Kenji Taniguchi1  Bunsei Murakami1  Sungwoo Cha1  Toshimasa Matsuoka1  Yoshihiro Utsurogi1  Gue Chol Kim1  Keisuke Ueda1 
[1] Graduate School of Engineering, Osaka University
关键词: FD-SOI;    MOSFET;    RF;    modeling;    drain current response delay;   
DOI  :  10.1587/elex.1.518
学科分类:电子、光学、磁材料
来源: Denshi Jouhou Tsuushin Gakkai
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【 摘 要 】

References(5)Cited-By(1)We investigated the frequency dependences of Y22 of FD-SOI MOSFETs, in which the drain current response delay is observed for the first time. Short channel FD-SOI devices operating in linear region show significant drain current response delay. It is confirmed that FD-SOI MOSFET's RF behavior can be well reproduced with the proposed model including the drain current response delay.

【 授权许可】

Unknown   

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