会议论文详细信息
Scanning Probe Microscopy 2018
Applications of atomic force microscope manipulator operating in hybrid mode
Zhukov, A.A.^1
Institute of Solid State Physics, Russian Academy of Science, Chernogolovka
142432, Russia^1
关键词: AFM tip;    Hybrid mode;    Liquid flow;    Microdrops;    Nanometres;    Topography images;   
Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/443/1/012039/pdf
DOI  :  10.1088/1757-899X/443/1/012039
来源: IOP
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【 摘 要 】

The topography images by atomic force microscope (AFM) operating in a new hybrid mode with nanometre scale noise are obtained. Using the improved feedback of the AFM hybrid mode, the possibility of the manipulations of the microdrops by microscope tip is shown. Additionally, we introduce a method of an extra gentle movement of nanowires by liquid flow organized by the AFM tip.

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