会议论文详细信息
Scanning Probe Microscopy 2018 | |
Applications of atomic force microscope manipulator operating in hybrid mode | |
Zhukov, A.A.^1 | |
Institute of Solid State Physics, Russian Academy of Science, Chernogolovka | |
142432, Russia^1 | |
关键词: AFM tip; Hybrid mode; Liquid flow; Microdrops; Nanometres; Topography images; | |
Others : https://iopscience.iop.org/article/10.1088/1757-899X/443/1/012039/pdf DOI : 10.1088/1757-899X/443/1/012039 |
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来源: IOP | |
【 摘 要 】
The topography images by atomic force microscope (AFM) operating in a new hybrid mode with nanometre scale noise are obtained. Using the improved feedback of the AFM hybrid mode, the possibility of the manipulations of the microdrops by microscope tip is shown. Additionally, we introduce a method of an extra gentle movement of nanowires by liquid flow organized by the AFM tip.
【 预 览 】
Files | Size | Format | View |
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Applications of atomic force microscope manipulator operating in hybrid mode | 614KB | download |