Synchrotron X-ray micro-tomography at the Advanced Light Source: Developments in high-temperature in-situ mechanical testing

X-Ray Microscopy Conference 2016

Barnard, Harold S.^1 ; MacDowell, A.A.^1 ; Parkinson, D.Y.^1 ; Mandal, P.^1 ; Czabaj, M.^2 ; Gao, Y.^3 ; Maillet, E.^3 ; Blank, B.^4 ; Larson, N.M.^5 ; Ritchie, R.O.^6 ; Gludovatz, B.^6 ; Acevedo, C.^6 ; Liu, D.^7

Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley

CA, United States^1

University of Utah, Dept. of Mechanical Engineering, Salt Lake City

UT, United States^2

GE Global Research, Niskayuna

NY, United States^3

Pulse Ray Inc., Beaver Dams

NY, United States^4

University of California, Dept. of Materials, Santa Barbara

CA, United States^5

Materials Sciences Division, Lawrence Berkeley Laboratory, Berkeley

CA, United States^6

Dept. of Materials, University of Oxford, Oxfordshire, Oxford, United Kingdom^7

关键词: Acoustic emission analysis;    Advanced Light Source;    Advanced light sources;    Hardware development;    High-temperature in situ;    Mechanical loading;    Realistic conditions;    Sample environment;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/849/1/012043/pdf
DOI  :  10.1088/1742-6596/849/1/012043

来源: IOP

【 摘 要 】

At the Advanced Light Source (ALS), Beamline 8.3.2 performs hard X-ray micro-tomography under conditions of high temperature, pressure, mechanical loading, and other realistic conditions using environmental test cells. With scan times of 10s-100s of seconds, the microstructural evolution of materials can be directly observed over multiple time steps spanning prescribed changes in the sample environment. This capability enables in-situ quasi-static mechanical testing of materials. We present an overview of our in-situ mechanical testing capabilities and recent hardware developments that enable flexural testing at high temperature and in combination with acoustic emission analysis.