会议论文详细信息
17th Pan-American Synchrotron Radiation Instrumentation Conference
ALS-II, a Potential Soft X-ray, Diffraction Limited Upgrade of the Advanced Light Source
Tarawneh, H.^1 ; Steier, C.^1 ; Falcone, R.^1 ; Robin, D.^1 ; Nishimura, H.^1 ; Sun, C.^1 ; Wan, W.^1
Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, CA 94720, United States^1
关键词: Advanced Light Source;    Advanced light sources;    Correlation spectroscopy;    Diffraction microscopy;    Experimental methods;    Resonant inelastic soft X-ray scattering;    Scientific applications;    Transverse coherence;   
Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/493/1/012020/pdf
DOI  :  10.1088/1742-6596/493/1/012020
来源: IOP
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【 摘 要 】

The Advanced Light Source (ALS) at Berkeley Lab has seen many upgrades over the years, keeping it one of the brightest sources for soft x-rays worldwide. Recent developments in magnet technology and lattice design appear to open the door for very large further increases in brightness [1], particularly by reducing the horizontal emittance, even within the space constraints of the existing tunnel. Initial studies for possible lattices will be presented that could approach the soft x-ray diffraction limit around 2 keV in both planes within the ALS footprint. Emerging scientific applications and experimental methods that would greatly benefit from ring based sources having much higher brightness and transverse coherence than present or near future storage ring facilities include nanometer imaging applications, X-ray correlation spectroscopy, diffraction microscopy, holography, ptychography, and resonant inelastic soft X-ray scattering at high resolution.

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