Scanning Transmission X-ray Microscopy with X-ray Fluorescence Detection at the XUV Beamline P04, PETRA III, DESY

X-Ray Microscopy Conference 2016

Andrianov, K.^1 ; Lühl, L.^2 ; Nisius, T.^1 ; Haidl, A.^1 ; Gnewkow, R.^2 ; Lötgering, L.^1 ; Dierks, H.^2 ; Kanngießer, B.^2 ; Wilhein, T.^1

Institute for X-Optics, University of Applied Sciences, Koblenz Rhein-Ahr-Campus, Joseph-Rovan-Allee 2, Remagen

53424, Germany^1

Institute of Optics and Atomic Physics, Technical University of Berlin, Hardenbergstr. 36, Berlin

10623, Germany^2

关键词: Elemental distribution;    Energy dispersive detectors;    High-resolution imaging;    Life-sciences;    Modular platform;    Scanning transmission x ray microscopy;    Transmission x-rays;    X ray fluorescence;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/849/1/012007/pdf
DOI  :  10.1088/1742-6596/849/1/012007

来源: IOP

【 摘 要 】

The presented scanning transmission x-ray microscope (STXM), build on top of our existing modular platform (FlexIX) for high resolution imaging experiments, allows versatile investigations of different samples. The FlexIX endstation allows to switch between a Full Field and a STXM mode. For the STXM mode we use a spatialy resolved detector together with an energy dispersive detector, this allows to investigate the morphology and the chemical or elemental distribution of the sample simultaneous. The combination of the nanoscopy endstation and the XUV beamline P04 results in a powerful tool for investigations of life science samples.