Interference filter with amorphous silicon layer and direct laser recording on it

5th International Conference of Photonics and Information Optics

Kutanov, A.^1 ; Sydyk Uluu, Nurbek^1 ; Snimshikov, I.^1 ; Kazakbaeva, Z.^2

Institute of Physical-Technical Problems and Material Science, National Academy of Sciences, Chuy prospect 265-a, Bishkek

720071, Kyrgyzstan^1

Department of Computer Engineering, Kyrgyz-Turkish Manas University, Chyngyz Aytmatov Campus, Bishkek

720038, Kyrgyzstan^2

关键词: Amorphous silicon layers;    Center wavelength;    Glass substrates;    Interference filters;    Narrow bandwidth;    Quasi-monochromatic;    Spectral filters;    White light sources;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/737/1/012025/pdf
DOI  :  10.1088/1742-6596/737/1/012025

来源: IOP

【 摘 要 】

The interference spectral filters with amorphous silicon layer deposited by magnetron sputtering on the reflective metal layer on a glass substrate are developed. Interference filter select from white light source components corresponding to quasimonochromatic wavelength with a narrow bandwidth. The thickness of the amorphous silicon layer determines the center wavelength of the pass band of the filter. It proposed to use interference filter with amorphous silicon layer for direct laser recoding on it. Results on direct laser recording on amorphous silicon layer of the interference filter by single-mode Blu Ray laser (X = 405 nm) with high contrast reflected image are demonstrated.