Measuring the work function of TiO2 nanotubes using illuminated electrostatic force microscopy

18th Microscopy of Semiconducting Materials Conference

物理学;材料科学

Smith, Graham X.R.^1 ; Crook, Rolf^1 ; Wadhawan, Jay D.^2

Faculty of Engineering, Energy Research Institute, University of Leeds, Woodhouse Lane, Leeds, LS2 9JT, United Kingdom^1

Department of Chemistry, University of Hull, Cottingham Road, Kingston-Upon-Hull, HU6 7RX, United Kingdom^2

关键词: Charge migration;    Electrostatic force microscopy;    TiO2 nanotubes;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/471/1/012045/pdf
DOI  :  10.1088/1742-6596/471/1/012045

学科分类：材料科学（综合）

来源: IOP

【 摘 要 】

The varying nature of TiO2nanotube work function as a function of illumination wavelength has been determined using illuminated electrostatic force microscopy. The dark work function was found to be 4.902 eV, with the largest change in work function due to illumination being at 300 nm, which was higher than the work function for bulk TiO2(4.899 eV). The change in work function due to illumination arises from the flattening of the energy bands at the surface due to charge migration.