Radiation hardness estimation in various temperature conditions under radiation impact

2nd International Telecommunication Conference "Advanced Micro- and Nanoelectronic Systems and Technologies"

Bakerenkov, A.S.^1 ; Rodin, A.S.^1 ; Felitsyn, V.A.^1 ; Pershenkov, V.S.^1

National Research Nuclear University MEPhI, MEPhI, Kashirskoe shosse 31, Moscow

115409, Russia^1

关键词: Input-bias current;    Operation temperature;    Radiation degradation;    Radiation hardness;    Radiation impacts;    Radiation response;    Recurrence relations;    Temperature conditions;   

Others  :  https://iopscience.iop.org/article/10.1088/1757-899X/498/1/012028/pdf
DOI  :  10.1088/1757-899X/498/1/012028

来源: IOP

【 摘 要 】

The application of the ELDRS conversion model for numerical simulation of the radiation degradation of input bias current in widely used voltage comparator is presented. The recurrence relations for numerical simulations were obtained and used calculations of the estimation of the radiation response of LM111 input bias current in real operation temperature conditions of TechEdSat satellite.