学位论文

1 A statistical study of time dependent reliability degradation of nanoscale MOSFET devices [学位论文]

作者:Hussin, Razaidi, Asenov, Asen

论文开放时间:2017

关键词:oxide;reliability,;...

培养单位:University:University of Glasgow

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2 a-Si:H-Silicon Hybrid Low Energy X-ray Detector [学位论文]

作者:Shin, Kyung-Wook

论文开放时间:2014

关键词:Detector;Thin Film Transistor;...

培养单位:University of Waterloo

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3 Uncalibrated TCAD methodology for analysis of ESD protection devices [学位论文]

作者:Chen, Zaichen

论文开放时间:2016

关键词:ESD;TCAD

培养单位:

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4 Operation of silicon-germanium heterojunction bipolar transistors on silicon-on-insulator in extreme environments [学位论文]

作者:Bellini, Marco, Electrical and Computer Engineering

论文开放时间:2009

关键词:SiGe;Extreme environments;...

培养单位:University:Georgia Institute of Technology

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5 Design, scaling and reliability of devices for high-performance mixed-signal applications [学位论文]

作者:Chakraborty, Partha Sarathi, Cressler, John D. Electrical and Computer Engineering Naeemi, Azad J. Vogel, Eric M. Mukhopadhyay, Saibal Davis, Jeffrey A., Cressler, John D.

论文开放时间:2015

关键词:Silicon-germanium;Heterojunction bipolar transistor;...

培养单位:University:Georgia Institute of Technology

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