Conductor surface roughness effect refers to the influence of surface roughness on the current flow inside a conductor and the subsequent effect on electromagnetic properties of the conductor. The existence of surface roughness on a conductor disturbs current flow and results in a higher than usual ohmic loss. This, in turn, impacts the performance of a variety of high-frequency interconnect, waveguide, and signal processing passive devices. It is, thus, very important to account for the impact of conductor surface roughness on the modeling and simulation used in support of the design of such devices. This thesis focuses on methodology of conductor surface roughness effect modeling, which provides accurate and efficient prediction using currently available commercial electromagnetic solvers. A methodology to account for the impact of random conductor surface roughness in the electromagnetic analysis is proposed. A compound conductor model is constructed based on the result from power absorption analysis and is used in place of the original rough-surface conductor to account for the effect of random conductor surface roughness. The model allows convenient and accurate modeling of the impact of conductor surface roughness and facilitates electromagnetic simulation of the device using commercial electromagnetic solvers. The advantage of an equivalent model for rough-surface conductor, in general, is reduction in the complexity associated with rough-surface modeling. The use of the proposed model and its advantages are demonstrated through the electromagnetic analysis of a microstrip transmission line structure and the accuracy is verified through correlations with measurement data. In addition, a microwave filter is modeled using the compound conductor approach.
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