Structure of Silicon Based Thin Film Solar Cell Materials. Annual Technical Progress Report, 1 April 2002-31 August 2002.

Williamson, D. L.

Technical Information Center Oak Ridge Tennessee

关键词: Solar cells;    Thin films;    Amorphous silicon;    Progress report;    Scattering;   

RP-ID  :  DE200415006546

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

The purpose of this research is to achieve a better understanding to improve materials used as the intrinsic layers of amorphous and microcrystalline silicon-based solar cells. Fundamental structural properties will be investigated on atomic and nano-scales. A powerful combination of techniques will be used: analytical high-resolution transmission electron microscopy (HRTEM), including special associated spectroscopic methods, small-angle scattering techniques (SAXS, ASAXS, SANS), and conventional wide-angle X-ray diffraction (XRD).