科技报告详细信息
Structure of Silicon Based Thin Film Solar Cell Materials. Annual Technical Progress Report, 1 April 2002-31 August 2002. | |
Williamson, D. L. | |
Technical Information Center Oak Ridge Tennessee | |
关键词: Solar cells; Thin films; Amorphous silicon; Progress report; Scattering; | |
RP-ID : DE200415006546 | |
学科分类:工程和技术(综合) | |
美国|英语 | |
来源: National Technical Reports Library | |
【 摘 要 】
The purpose of this research is to achieve a better understanding to improve materials used as the intrinsic layers of amorphous and microcrystalline silicon-based solar cells. Fundamental structural properties will be investigated on atomic and nano-scales. A powerful combination of techniques will be used: analytical high-resolution transmission electron microscopy (HRTEM), including special associated spectroscopic methods, small-angle scattering techniques (SAXS, ASAXS, SANS), and conventional wide-angle X-ray diffraction (XRD).
【 预 览 】
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DE200415006546.pdf | 2203KB | download |