Characterization of SEI Layers on LiMn2O4 Cathodes with In situ Spectroscopic Ellipsometry.

Lei, J. ; Li, L. ; Kostecki, R. ; Muller, R. ; McLarnon, F.

Technical Information Center Oak Ridge Tennessee

关键词: Cathodes;    Ellipsometry;    Electrodes;    Thickness;    Lithium;   

RP-ID  :  DE2005837416

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

In situ spectroscopic ellipsometry was employed to study the initial stage of SEI layer formation on thin-film LiMn(sub 2)O(sub 4) electrodes. It was found that the SEI layer formed immediately upon exposure of the electrode to EC/DMC (1:1 by vol) 1.0 M LiPF(sub 6) electrolyte. The SEI layer thickness then increased in proportion to a logarithmic function of elapsed time. In comparison, the SEI layer thickness on a cycled electrode increased in proportion to a linear function of the number of cycles.