Characterization of SEI layers on LiMn2O4 cathodes with in-situ spectroscopic ellipsometry

Lei, Jinglei ; Li, Lingjie ; Kostecki, Robert ; Muller, Rolf ; McLarnon, Frank

Lawrence Berkeley National Laboratory

关键词: Ellipsometry;    Thickness;    25 Energy Storage;    Cathodes;    Electrodes;   

DOI  :  10.2172/837416
RP-ID  :  LBNL--55939
RP-ID  :  AC03-76SF00098
RP-ID  :  837416

美国|英语

来源: UNT Digital Library

【 摘 要 】

In situ spectroscopic ellipsometry was employed to study the initial stage of SEI layer formation on thin-film LiMn{sub 2}O{sub 4} electrodes. It was found that the SEI layer formed immediately upon exposure of the electrode to EC/DMC (1:1 by vol) 1.0 M LiPF{sub 6} electrolyte. The SEI layer thickness then increased in proportion to a logarithmic function of elapsed time. In comparison, the SEI layer thickness on a cycled electrode increased in proportion to a linear function of the number of cycles.