General Electron Induced Emission (Genie) System Proposal.

Epps, M. ; Kazimi, R. ; Gueye, P.

Technical Information Center Oak Ridge Tennessee

关键词: Beam diagnostic system;    Beam position;    Beam currents;    Beam emittance;    Beam optics;   

RP-ID  :  DE2005839992

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

A real time beam diagnostic system is proposed for the Jefferson lab injector region. The General ElectroN Induced Emission system (GENIE) consists of a package that includes both hardware (beam monitoring devices) and software (for 3D or 4D visualization of the beam transport). This beam diagnostic tool uses (very small) scintillating fibers placed in different planes to extract the: beam profile, beam position, beam current, and beam emittance in real time. Accuracies in position and angle could be at the sub- (micro)m and (micro)rad levels, respectively. The beam current could be reconstructed within a few percent. A combined Geant4/Parmela simulation will be developed for beam optic studies. While Parmela offers the power of beam transport with phase matching capabilities (among others), Geant4 provides secondary particles tracking, as well as 3D & 4D visualization, to name a few. A phase I investigation of GENIE using a 100 keV line in the test lab is discussed in this document.