On the beam emittance/brilliance of highly charged ions extracted from the Frankfurt 14GHz Electron-Cyclotron-Resonance-Ion-Source in standard and enhanced (MD) mode

30th International Conference on Photonic, Electronic, and Atomic Collisions

Müller, J.C.^1 ; Dörner, R.^1 ; King, F.^1 ; Schaechter, L.^2 ; Stiebing, K.E.^1

Institute for Nuclear Physics, Goethe Universitaet, Max von Laue Str. 1, Frankfurt am Main

D-60438, Germany^1

National Institute for Physics and Nuclear Engineering, Bucharest

77425, Romania^2

关键词: Beam emittance;    Electron cyclotron resonance ion source;    Emittances;    Gas-mixing;    Highly charged ions;    Wall coatings;   

Others  :  https://iopscience.iop.org/article/10.1088/1742-6596/875/10/092002/pdf
DOI  :  10.1088/1742-6596/875/10/092002

来源: IOP

【 摘 要 】

Synopsis Electron Cyclotron Resonance Ion Sources (ECRIS) provide only moderate emittances as compared to other types of ion sources. Besides considerable effort to improve the total output of ECRIS's by dedicated modifications (gas mixing, wall coating etc.), it is important to also determine the influence of such improvements on the beam quality. In this contribution dedicated experiments on the influence of the MD method [1] on the emittance/ brilliance of extracted ion beams from the Frankfurt 14GHz ECRIS are presented.