Trends in the Design of Front-end Systems for Room Temperature Solid State Detectors.

Manfredi, P. F. ; Re, V.

Technical Information Center Oak Ridge Tennessee

关键词: Semiconductor detectors;    Solid state detectors;    Weighting functions;    Design;    Noise radiation hardness;   

RP-ID  :  DE2005836963

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

The paper discusses the present trends in the design of low-noise front-end systems for room temperature semiconductor detectors. The technological advancement provided by submicron CMOS and BiCMOS processes is examined from several points of view. The noise performances are a fundamental issue in most detector applications and suitable attention is devoted to them for the purpose of judging whether or not the present processes supersede the solutions featuring a field-effect transistor as a front-end element. However, other considerations are also important in judging how well a monolithic technology suits the front-end design. Among them, the way a technology lends itself to the realization of additional functions, for instance, the charge reset in a charge-sensitive loop or the time-variant filters featuring the special weighting functions that may be requested in some applications of CdTe or CZT detectors.