Comparison of Buffer Layer Architectures on Continuously Processed YBCO Coated Conductors Based on the IBAD YSZ Process.

Holesinger, T. G. ; Foltyn, S. R.

Technical Information Center Oak Ridge Tennessee

关键词: Buffers;    Superconductivity;    Microstructure;    Film deposition;    Coatings;   

RP-ID  :  DE2000762850

学科分类：工程和技术（综合）

美国|英语

来源: National Technical Reports Library

【 摘 要 】

The microstructures of continuously processed Yba2Cu3Oy (YBCO) coated conductors processed with three different architectures are presented. YBCO films were deposited directly on ion-beam-assisted deposition (IBAD) yttria-stabilized zirconia (YSZ) or on intervening layers of Y2O3 or CeO2. Different interfacial reactions were observed in each case. The volume changes that occur with the interfacial reactions were calculated based on the identified reaction products. The calculated volume changes correlate with the in determining an optimal buffer layer system. The interfacial reactions do not preclude the attainment of high Ic and Jc values in these coated conductors.