Freeform Surface Characterization and Instrument Alignment for Freeform Space Applications

Khreishi, Manal ; Ohl, Raymond ; Howard, Joseph ; Papa, Jonathan ; Hovis, Clark ; Howe, Andrew ; Hadjimichael, Theodore ; Thompson, Patrick ; Shiri, Ron ; West, Garrett(NASA Goddard Space Flight Center, Greenbelt, MD, United States)

关键词: MIRRORS;    FABRICATION;    SURFACE PROPERTIES;    CHARACTERIZATION;    METROLOGY;    ALIGNMENT;    OPTICAL EQUIPMENT;    INSTRUMENT ERRORS;    INTERFEROMETERS;    THREE DIMENSIONAL MODELS;    SMALL SCIENTIFIC SATELLITES;    TELESCOPES;    CALIBRATING;   

RP-ID  :  GSFC-E-DAA-TN69408

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来源: NASA Technical Reports Server

【 摘 要 】

CMM (Coordinate Measuring Machine) metrology provides simple, 3D (three dimensional) surface data used for prescription retrieval, figure error, and alignment with high accuracy without null-correctors. Two freeform mirrors for a compact telescope were successfully characterized and aligned using the CMM.