Proton Testing of nVidia GTX 1050 GPU, Part 2

Wyrwas, E J

关键词: CONTROL SYSTEMS DESIGN;    RADIATION EFFECTS;    COMMERCIAL OFF-THE-SHELF PRODUCTS;    PROTONS;    FAILURE;    RADIATION TOLERANCE;    COMPUTER PROGRAMS;   

RP-ID  :  2018-561-NEPP,GSFC-E-DAA-TN58471

学科分类：电子与电气工程

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

Single-Event Effects (SEE) testing was conducted on the nVidia GTX 1050 Graphics Processor Unit (GPU); herein referred to as device under test (DUT). Testing was conducted at Massachusetts General Hospital's (MGH) Francis H. Burr Proton Therapy Center on April 28th, 2018 using 200-MeV protons. This testing trip was purposed to provide additional radiation susceptibility data from payloads compiled in Q3FY18. While not all radiation-induced errors are critical, the effects on the application need to be considered. More so, failure of the device and an inability to reset itself should be considered detrimental to the application. Radiation effects on electronic components are a significant reliability issue for systems intended for space.