Operation of Ultrafast, Low-Side MOSFET Driver, IXD609, over Wide Temperature Range

Boomer, Kristen ; Hammoud, Ahmad

关键词: CHIPS;    COMMERCIAL OFF-THE-SHELF PRODUCTS;    CONTROL SYSTEMS DESIGN;    DESIGN ANALYSIS;    ELECTRIC POTENTIAL;    FIELD EFFECT TRANSISTORS;    METAL OXIDE SEMICONDUCTORS;    OPERATING TEMPERATURE;    SPACE EXPLORATION;    SYSTEMS ANALYSIS;    TEST CHAMBERS;    THERMAL CYCLING TESTS;   

RP-ID  :  GRC-E-DAA-TN73724

学科分类：电子与电气工程

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

Electrical power and control systems designed for use in planetary exploration missions and deep space probes require electronics that are capable of efficient and reliable operation under extreme temperature conditions. In addition, space-based infrared satellites, all-electric ships, jet engines, electromagnetic launchers, magnetic levitation transport systems, and power facilities are also typical examples where system electronics are expected to be exposed to harsh temperatures and to operate under severe thermal swings. Most commercial-off-the-shelf (COTS) devices are not designed to function under such extreme conditions and very little data exist on their performance outside their specified range of operation. In this work, the performance of an ultrafast gate driver for controlling power-level transistors was evaluated under extreme temperatures and thermal cycling. The investigations were carried out to assess performance for potential use of this device in space exploration missions under extreme temperature conditions.