Government Microelectronics Assessment for Trust (GOMAT)

Berg, Melanie D ; LaBel, Kenneth A

关键词: MICROELECTRONICS;    RISK ASSESSMENT;    RISK MANAGEMENT;    ASSURANCE;    PROVING;    DESIGN ANALYSIS;    ELECTRONIC PACKAGING;    FIELD-PROGRAMMABLE GATE ARRAYS;    APPLICATION SPECIFIC INTEGRATED CIRCUITS;    FAILURE ANALYSIS;    BAYES THEOREM;   

RP-ID  :  GSFC-E-DAA-TN65838,GSFC-E-DAA-TN53177

学科分类：电子与电气工程

美国|英语

来源: NASA Technical Reports Server

【 摘 要 】

NASA Electronic Parts and Packaging (NEPP) is developing a process to be employed in critical applications. The framework assesses levels of trust and assurance in microelectronic systems. The process is being created with participation from a variety of organizations. We present a synopsis of the framework that includes contributions from The Aerospace Corporation.