Innovative Characterization of Amorphous and Thin-Film Silicon for Improved Module Performance: 28 April 2005 - 15 September 2008

Cohen, J. D.

National Renewable Energy Laboratory (U.S.)

关键词: Alloys;    Pv;    Electronic Properties;    36 Materials Science;    Impurities;   

DOI  :  10.2172/969715
RP-ID  :  NREL/SR-520-47195
RP-ID  :  AC36-99-GO10337
RP-ID  :  969715

美国|英语

来源: UNT Digital Library

【 摘 要 】

This report focuses on (1) characterizing nc-Si:H from United Solar; (2) studying Si,Ge:H alloys deposited by HWCVD; and (3) characterizing CIGS films and relating to cell performance parameters.