Wave-Based Inversion & Imaging for the Optical Quadrature Microscope

Lehman, S K

Lawrence Livermore National Laboratory

关键词: Amplitudes;    Refractive Index;    Microscopes;    Diffraction;    42 Engineering;   

DOI  :  10.2172/886667
RP-ID  :  UCRL-TR-217047
RP-ID  :  W-7405-ENG-48
RP-ID  :  886667

美国|英语

来源: UNT Digital Library

【 摘 要 】

The Center for Subsurface Sensing & Imaging System's (CenSSIS) Optical Quadrature Microscope (OQM) is a narrow band visible light microscope capable of measuring both amplitude and phase of a scattered field. We develop a diffraction tomography, that is, wave-based, scattered field inversion and imaging algorithm, for reconstructing the refractive index of the scattering object.